A Fast Defects Location Method in ICT Images Based on Block Fractal Dimension

作     者：CHEN Pei-xing WANG Ming-quan HOU Hui-ling LI Shi-hu 

作者机构：School of Information and Communication EngineeringNorth University of China Key Laboratory of Instrumentation Science & Dynamic MeasurementNorth University of China 

基　　金：Supported by National Nature Science Foundation of China(No.61171177) 

出 版 物：《Computer Aided Drafting,Design and Manufacturing》 (计算机辅助绘图设计与制造（英文版）)

年 卷 期：2015年第25卷第1期

页      码：1-6页

摘      要：Non-destructive testing （NDT） has been widely used in many fields, we can easily see it is being used in shipbuilding, aerospace, weapons manufacturing and so on. ICT is one of the best non destructive testing methods currently, but it has not been used widely, because it requires much compute and costs much time. Defect location is one of the most important processing steps in the digital image analysis. Defect location would correspondingly reduce the time spent in the testing. We may only require locating the defects in some case. So, we divide the CT images into several little blocks which the square is equal, and then calculate the fractal on each block. By determining the value and connected region number of the fractal dimension, we can locate defects of the image. The results show that the block ffactal dimension is a useful and time-saving defect location method.

主 题 词：defect location fractal dimension block ICT edge 

学科分类：08[工学] 080203[080203] 0802[工学-机械学] 

D　O　I：10.19583/j.1003-4951.2015.01.001

馆 藏 号：203109228...