FAULT DETECTION TEST SET FOR TESTABLE REALIZATIONS OF LOGIC FUNCTIONS WITH ESOP EXPRESSIONS

作     者：Pan Zhongliang Chen Guangju 

作者机构：School of Physics and Telecommunication Engineering South China Normal University Guangzhou 510631 China Institute of Automation Engineering University of Electronic Science and Technology of China Chengdu 610054 China 

基　　金：Supported by the National Natural Science Foundation of China (No.60006002) the Education Department of Guangdong Province of China (No.02019) 

出 版 物：《Journal of Electronics(China)》 (电子科学学刊（英文版）)

年 卷 期：2007年第24卷第2期

页      码：238-244页

摘      要：The circuit testable realization and its fault detection for logic functions with ESOP （EXOR-Sum-Of-Products） expressions are studied. First of all, for the testable realization by using XOR gate cascade, a test set with 2n ＋ m ＋ 1 vectors for the detections of AND bridging faults and a test set with 2n ＋ m vectors for the detections of OR bridging faults are presented. Secondly, for the testable realization by using ）（OR gate tree, a test set with 2n ＋ m vectors for the detections of AND bridging faults and a test set with 3n ＋ m ＋ 1 vectors for the detections of OR bridging faults are presented. Finally, a single fault test set with n ＋ 5 vectors for the XOR gate tree realization is presented. Where n is the number of input variables and m is the number of product terms in a logic function.

主 题 词：Logic functions Testable realization Fault detection Single faults Bridging faults 

学科分类：080903[080903] 0809[工学-计算机类] 08[工学] 

D　O　I：10.1007/s11767-005-0224-5

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