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文献详情 >Analyzing and mitigating the intern... 收藏
Analyzing and mitigating the internal single-event transient in radiation hardened flip-flops at circuit-level

Analyzing and mitigating the internal single-event transient in radiation hardened flip-flops at circuit-level

作     者:LIANG Bin SONG RuiQiang 

作者机构:College of Computer National University of Defense Technology 

基  金:supported by the National Natural Science Foundation of China(Grant No.61376109) 

出 版 物:《Science China(Technological Sciences)》 (中国科学(技术科学英文版))

年 卷 期:2014年第57卷第9期

页      码:1834-1839页

摘      要:Internal SET has become a great concern in normal radiation-hardened flip-flops with increases in *** investigate the internal SET problem in the traditional hardened flip-flops in this *** also propose a novel structure to eliminate the internal SET ***-dimensional technology computer-aided design(TCAD)was adopted to verify the hardened performance of this proposed novel ***,the power and setup time were compared with the traditional hardened flip-flops.

主 题 词:flip-flops DICE internal SET 

学科分类:080902[080902] 0809[工学-计算机类] 08[工学] 0805[工学-能源动力学] 080502[080502] 

核心收录:

D O I:10.1007/s11431-014-5595-0

馆 藏 号:203147343...

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