Low-Loss Dielectric Material Characterization and High-Q Resonator Design from Microwave to Millimetre Waves Frequencies

作     者：Jean-Michel Le Floch Michael E. Tobar Georges Humbert David Mouneyrac Denis Ferachou Romain Bara Michel Aubourg John G. Hartnett Dominique Cros Jean-Marc Blondy Jerzy Krupka 

作者机构：School of Physics University of Western Australia 35 Stirling Hwy 6009 Crawley Western Australia XLIM UMR CNRS No 6172 123 av. A. Thomas 87060 Limoges Cedex France Institute of Microelectronics and Optoelectronics Warsaw University of Technology Kosykowa 75 Warsaw Poland 

出 版 物：《Journal of Physical Science and Application》 (物理科学与应用（英文版）)

年 卷 期：2011年第1卷第1期

页      码：15-28页

摘      要：Dielectric resonators are key components in many microwave and millimetre wave circuits and applications, including high-Q filters and frequency-determining elements for precision frequency synthesis. Multilayered and bulk low-loss single crystal and polycrystalline dielectric structures have become very important for designing these devices. Proper design requires careful electromagnetic characterisation of low-loss material properties. This includes exact simulation with precision numerical software and precise measurements of resonant modes. For example, we have developed the Whispering Gallery mode technique, which has now become the standard for characterizing low-loss structures. This paper will review some of the common characterisation techniques used in the microwave to millimetre wave frequency regime.

主 题 词：《物理科学与应用:英文版》 期刊 编辑部 编辑工作 

学科分类：050302[050302] 05[文学] 07[理学] 0503[文学-新闻传播学类] 0702[理学-物理学类] 

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