摘要：Ni/Ti multilayers, which can be used for neutron monochromators, are designed, fabricated and measured. Firstly, their reflectivities are simulated based on the Nevot-Croce model. Reflectivities of two Ni/Ti multilayer mirrors with periods d = 10.3 nm （M1） and d = 7.8 nm （M2） are calculated. In the calculation, the reflectivity of the Ni/Ti multilayer is taken as a function of the gazing angle with different roughness factors δ =1.0 nm and = 1.5 nm. Secondly, these two multilayers are fabricated by the direct current magnetron sputtering technology. Thirdly their structures are characterized by small-angle x-ray diffraction. The roughness factors are fitted to be 0.68 nm and 1.16nm for M1 and M2, respectively. Finally their reflective performances are measured on the V14 neutron beam line at the Berlin Neutron Scattering Centre （BENSC）, Germany. The experimental data show that the grazing angle of the reflected neutron intensity peak increases, but the reflected neutron intensity decreases, with the decreasing periods of the multilayers.

摘要：研究了极紫外宽带多层膜偏振光学元件,包括反射式检偏器与透射式相移片。基于Mo/Si非周期多层膜结构,采用解析与数值优化相结合的方法进行了多层膜的设计;采用磁控溅射技术制备了多层膜。利用X射线衍射仪对非周期多层膜的结构进行了表征,利用德国BESSY-II同步辐射实验室的偏振测量仪对多层膜的偏振特性进行了测试。测量结果表明,在13 ～19 nm波段,s偏振分量的反射率高于15 %;在15 ～17 nm波段,获得了37 %的反射率。宽带多层膜同样可作为宽角偏振光学元件,在13 .8 ～15 .5 nm波段,宽带透射相移片的平均相移为41 .7°。采用所研制的宽带多层膜相移片与检偏器,建立了宽带偏振分析系统,并对BESSY-II的UE56/1 PGM1光束线的偏振特性进行了系统研究。这种宽带多层膜偏振光学元件可以极大地简化极紫外偏振测量。

摘要：简要阐述了强吸收波段亚四分之一波长多层膜的设计方法。这种膜系是由强吸收材料叠加而成,每层膜光学厚度小于四分之一个波长。与常规周期多层膜相比,这种膜系更适用于提高强吸收波段的反射率。利用该方法设计了50nm^110nm波段宽带高反膜的初始膜系,通过Levenberg-M arquart方法对初始膜系进行优化,从而得到宽波段的平坦反射率,其平均反射率达到45%。

摘要：选用能制备小周期的钨/硅(W/S i)作为膜层材料对,着重研究最小膜层厚度对X射线非周期多层膜光学性能的影响。基于矩阵法计算多层膜反射率和单纯形数值优化方法,设计了入射光子能量为8.0keV,掠入射角的宽度分别为0.85°~1.10°,1.40°~1.70°的X射线超反射镜。结合实际实验制备技术,考虑了W/S i两种膜层材料的最小成膜厚度,确定了膜堆中最小膜层厚度为0.5nm^1.0nm。通过改变最小膜层厚度的值,优化设计了上述条件下的非周期多层膜并对其光学性能进行比较。结果表明:同一个工作波长下,随着多层膜工作角度(掠入射)的增加,膜堆中膜层的厚度减小,最小膜层厚度对其光学性能的影响增加,其光学性能变差。

摘要：设计并制备了窄带M o/S i多层膜反射镜。利用高反射级次和减小M o层厚度两种方法减小M o/S i多层膜反射镜光谱宽度。对M o层厚度分别为2 nm和3 nm的M o/S i多层膜,设计了反射级次分别从1到6的多层膜系。制备方法采用直流磁控溅射技术,在国家同步辐射光谱与计量站上测试。结果表明,带宽随着反射级次增加而减少,在同一反射级次,M o层厚度为2 nm的多层膜反射光谱带宽较小。