摘要：When a proton reduction cocatalyst is loaded on an n-type semiconductor for photocatalytic overall water splitting(POWS),the location of water oxidation sites is generally considered at the surface of the semiconductor due to upward band-bending of n-type semiconductor which may ease the transfer of the photogenerated holes to the ***,this is not the case for Pt/SrTiO_(3),a model semiconductor based photocatalyst for *** was found that the photogenerated holes are more readily accumulated at the interface between Pt cocatalyst and SrTiO_(3) photocatalyst as probed by photo-oxidative deposition of PbO_(2),indicating that the water oxidation sites are located at the interface between Pt and SrTiO_(3).Electron paramagnetic resonance and scanning transmission electron microscope studies suggest that the interfacial oxygen atoms between Pt and SrTiO_(3) in Pt/SrTiO_(3) after POWS are more readily lost to form oxygen vacancies upon vacuum heat treatment,regardless of Pt loading by photodeposition or impregnation methods,which may serve as additional support for the location of the active sites for water oxidation at the *** functional theory calculations also suggest that the oxygen evolution reaction more readily occurs at the interfacial sites with the lowest *** experimental and theoretical studies reveal that the more active sites for water oxidation are located at the interface between Pt and SrTiO_(3),rather than on the surface of SrTiO_(3).Hence,the tailor design and control of the interfacial properties are extremely important for the achievement or improvement of the POWS on cocatalyst loaded semiconductor photocatalyst.

摘要：针对现有的棱镜-光栅的组合设计存在结构复杂、调试困难的问题,建立了三棱镜-光栅组合色散的数学模型,提出了仅需改变三棱镜、光栅的空间相对位置来提高光谱色散线性度的双目标优化方法,获得了线性度良好的棱镜-光栅组合结构参数。采用光学标准件对模型的正确性进行仿真和实验验证。仿真结果表明:在400~1000 nm波段,系统具有长为15 cm、光谱线性度良好、结构简单的特点。实验结果表明,在420~780 nm波段,整体分辨率优于2 nm,进一步证明了该方法的有效性。本研究为棱镜-光栅组合设计提供了一种灵活、简单的结构设计方法。

摘要：BIM技术是一种应用于工程设计建造管理的数据化工具,通过数字模型整合项目的各种相关信息,广泛地应用于建筑业中。文章介绍了BIM技术在汉中兴元东翼安置区地块Ⅲ项目施工阶段的应用情况及其产生的效益,也总结了创新点及经验教训。BIM技术的应用,提高了生产效率、节约成本,缩短了施工工效。

摘要：时间常数是热电偶关键动态特性参数之一。传统时间常数测试方法作用时间短、响应时间长,无法满足日益发展的新型高响应速度热电偶的动态测试。研究搭建了基于高功率半导体激光器的热电偶时间常数测试系统,系统半导体激光器、光学系统、平衡电桥、YBF-1851型动态应变仪、数据采集处理系统等。设计了激光器准直聚焦光学系统,测试了不同加热条件下K型热电偶和钨铼热电偶的时间常数,分别为1.10和0.25s。对实验结果分析表明,该系统精度较高、操作简单、实用性好,可以对高速响应的普通热电偶和薄膜热电偶进行动态测试,有效解决航空航天、军事、化工等领域的热电偶动态标定难题。