摘要：The recent rapid development of electronics and continual increase of the complexity and variety of electronic circuits (chips, packets, micro- and embedded systems) creates a demand for viable test and diagnostic methods. These recent developments have led to a great deal of research interest in electronic diagnostic systems, especially of effective diagnosis methods of detection, localization and identification levels of hard (catastrophic) and soft (parametric) faults in analog circuits. At present, the majority of electronic devices (embedded systems) are designed based on digital circuits;however a lot of them also contain analog components that require more complicated testing techniques. This paper presents a novel, electronic components tester board with inside, outside of circuit under tested. The design is first simulated by using the electronic work-bench software Multisim 11 in order to obtain satisfactory theoretical results for each standalone element of the design. Thereafter, the design is practically implemented and experimentally verified to show agreement with the simulated results.