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Atomic-scale observation of the deformation and failure of diamonds by in-situ double-tilt mechanical testing transmission electron microscope holder
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《Science China Materials》2020年 第11期63卷 2335-2343页
作者:Yizhi Zhang yeqiang bu Junquan Huang Tianye Jin Anmin Nie Hongtao Wang Yongjun TianCenter for X-MechanicsZhejiang UniversityHangzhou 310027China Institute of Applied MechanicsZhejiang UniversityHangzhou 310027China Center for High Pressure ScienceState Key Laboratory of Metastable Materials Science and TechnologyYanshan UniversityQinhuangdao 066004China 
In-situ transmission electron microscopy(TEM)has been demonstrated to be a powerful method in resolving challenging problems such as interactions among various *** take advantage of the atomic resolution of advanced T...
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