摘要：Technology development and continuous down scaling in CMOS fabrication makes Mixed Signal Integrated Circuits (MSIC) more vulnerable to process variation. This paper presents a well defined novel design methodology for process variability aware design by incorporating the major challenge of statistical circuit performance relating the device and circuit level variation in an accurate and efficient manner to improve the reliability, robustness and stability of the circuit. The device sensitive parameters are identified and accurately quantified by continuous realistic assessments using statistical methods. The modularity of the methodology can be validated by the output performance obtained from the gain and phase response of OTA which is highly stable when subjected to worst case process variation scenario. In the proposed optimization, the circuit is strengthened by fixing the optimum aspect ratio without adding any additional compensation devices complicating the circuit resulting in low power consumption of only 0.116 mW in standard CMOS 0.18 μm technology with 1.8 V power supply.