摘要：Since single event transient pulse quenching can reduce the set(single event transient) pulsewidths effectively,the charge collected by passive device should be maximized in order to minimize the propagated *** the perspective of the layout and circuit design,the set pulsewidths can be greatly inhibited by minimizing the layout spacing and signal propagation delay,which sheds new light on the radiation-hardened ICs(integrated circuits) *** show that the set pulsewidths of propagation are not in direct proportion to the LET(linear energy transfer) of incident particles,thus the defining of the LET threshold should be noted when set/SEU(single event upset) occurs for the radiation-hardened *** capability of anti-radiation meets the demand when LET is high but some soft errors may occur when LET is ***,radiation experiments should be focused on evaluating the LET that demonstrates the worst response to the circuit.