摘要：In semiconductor manufacturing process, probe station that is testing equipment is important. Inspection step is for detecting defects on semiconductor before the packaging. Probe card is a part of probe station and contains probe tip that contacts to semiconductor. Through probe tip, it can inspect defects of semiconductor. In this paper, optimization method is used with response surface analysis to design MEMS type probe tip. And fabricating probe tip uses maskless lithography, electro-plating and lapping process.

摘要：分析基于主题意义的高中英语using Language读写课的教学优势。以人教版高中《英语》必修2 Unit 3 Computers using Language读写课为例,阐明围绕主题语境设计高中英语using Language读写课的具体策略。

摘要：目前，高中英语综合课存在教学目标偏离、教学模式僵化、驾驭教材乏力的问题。针对这些问题，本文构建了USE教学模式，即：Understanding（理解）→Sharing（分享）→Expressing（表达），并利用该模式设计了一个教学实例，以诠释综合语言技能课的教学程序及其操作应用。