摘要：Embedded phase-change random-access memory(ePCRAM)applications demand superior data retention in amorphous phase-change materials(PCMs).Traditional PCM design strategies have focused on enhancing the thermal stability of the amorphous phase,often at the expense of the crystallization *** this approach supports reliable microchip operations,it compromises the ability to achieve rapid *** address this limitation,we modified ultrafast-crystallizing Sb thin films by incorporating Sc dopants,achieving the highest 10-year retention temperature(~175℃)among binary antimonide PCMs while maintaining a sub-10-ns SET operation *** reconciliation of two seemingly contradictory properties arises from the unique kinetic features of the 5-nm-thick Sc12Sb88 films,which exhibit an enlarged fragile-to-strong crossover in viscosity at medium supercooled temperature zones and an incompatible sublattice ordering behavior between the Sc and Sb *** tailoring the crystallization kinetics of PCMs through strategic doping and nanoscale confinement,we provide new opportunities for developing robust yet swift ePCRAMs.